Abstract
We have developed a highly-integrated digital X-ray imaging sensor based upon a complementarymetal-oxide semiconductor (CMOS) array coupled with a columnar CsI(Tl) scintillator and an X-ray conversion fiberoptic plate for dental intraoral-imaging applications. The sensor consists of a commercially-available CMOS array with a 35 μm × 35 μm pixel size and a 24.1 mm × 31.6 mm active area, and a high-efficiency columnar CsI(Tl) scintillator of 90 μm in thickness directly deposited on a fiberoptic plate of a 6 μm in core size and 1.45 mm in thickness. In this paper, we describe the highly-integrated digital X-ray imaging sensor and evaluate its performance in terms of the modulation transfer function (MTF), the noise power spectrum (NPS), and the detective quantum efficiency (DQE), as indicators of image quality.
Published Version
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