Abstract
High resolution transmission electron microscopy (HRTEM) images contain a large amount of information. Digital image processing techniques offer opportunities to extract the relevant part of the information, thus simplifying the interpretation of the image. Several textbooks have appeared1,2 which give an introduction into the subject of image processing in electron microscopy, with main applications in biology and organic materials. For these samples the need for image processing follows mainly from the extreme sensitivity of the specimens to the electron beam. The very bad signal-to-noise ratio (S/N) at high resolution is often improved by spatial averaging or Fourier filtering techniques. An image with a large number of identical contrast units is then needed, preferentially arranged on a periodic lattice.
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