Abstract
Primary and secondary crystallographic constants can be utilized conveniently for identifications of crystalline organic and inorganic materials by microscopy and X-ray diffractometry. Several specific properties can be measured under the petrographical microscope, including optic axial angle, character, dispersion, and in addition, refractive index directions can be established. The “d” spacings and their intensities as determined with the X-ray diffractometer serve to identify crystalline materials. The two instruments should be considered as supplementary tools for identifying crystals. Both instruments supply a means for identification and semiquantitative analysis of mixed crystal systems. Data are presented for the systems: acetic-propionic p-bromoanilides and acet-propion-2.4-dinitro-phenylhydrazones.
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