Abstract
The Ag37Sn33Te30 film has been investigated todetermine its suitability as phase change optical recording alloy basedon static tester and atomic force microscopy measurements. Switchingproperties and the recording bit topography of the film are studied.With a writing pulse of power 2.5 mW, width 10 μs, and an erasure pulseof power 0.25 mW, width 10 μs, optical contrast of 31.8% is obtained.Re-crystallization experiments identify the Ag37Sn33Te30film as a suitable phase change material for optical data storage with acomplete erasure time of 1.1 μs at low erasure power.
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