IBIC study of charge collection properties in Si(Li) detectors

Abstract

The nuclear microprobe technique ion beam induced charge (IBIC) has been used to probe the charge collection efficiency across the front surface of Si(Li) X-ray detectors. IBIC was performed using 2.667 MeV 6Li ions, avoiding the large penetration depth of the conventional proton-IBIC. The front surfaces of two Si(Li) detectors were scanned to image inhomogeneities of incomplete charge collection (ICC). The relationship between the X-ray peak shape of the tested detectors and the degree of incomplete charge collection is discussed.