Abstract

Transition metal defects in SiC give rise to localized electronic states that can be optically addressed in the telecom range in an industrially mature semiconductor platform. This has led to intense scrutiny of the spin and optical properties of these defect centers. For spin-1/2 defects, a combination of the defect symmetry and the strong spin–orbit coupling may restrict the allowed spin transitions, giving rise to defect spins that are long lived, but hard to address via microwave spin manipulation. Here, we show via analytical and numerical results that the presence of a central nuclear spin can lead to a non-trivial mixing of electronic spin states, while preserving the defect symmetry. The interplay between a small applied magnetic field and hyperfine coupling opens up magnetic microwave transitions that are forbidden in the absence of hyperfine coupling, enabling efficient manipulation of the electronic spin. We also find that an electric microwave field parallel to the c-axis can be used to manipulate the electronic spin via modulation of the relative strength of the dipolar hyperfine term.

Highlights

  • Solid state defects and molecular centers with optically addressable spin provide versatile platforms for the implementation of quantum technologies [1,2,3,4,5,6,7,8]

  • The interplay between a small applied magnetic field and hyperfine coupling opens up magnetic microwave transitions that are forbidden in the absence of hyperfine coupling, enabling efficient manipulation of the electronic spin

  • The results of the previous section show that the apparent discrepancy between the symmetry protection of the transition metal (TM) spin-1/2 states and the observed magnetic resonance results on V defects can be fully resolved by considering the interaction with a central nuclear spin

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Summary

August 2021

Carmem M Gilardoni1,∗ , Irina Ion, Freddie Hendriks , Michael Trupke and Caspar H van der Wal.

Introduction
Methods
Crystal field potential
Spin–orbit coupling
Results
Discussion and conclusion
Data availability statement
Full Text
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