Abstract
Hydrogen depth profiles have been determined by 2.2 MeV 4He+-Elastic Recoil Detection (ERD) for sodium β′′-alumina crystals submitted to thermal annealing in dry atmosphere or ion implantation. The results demonstrate the usefulness of this technique as an auxiliary tool for the analysis of water retention by these crystals. Simultaneous Rutherford Backscattering (RBS) Spectrometry analysis were also made.
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