Hybrid reflections from multiple x-ray scattering in epitaxial oxide films

Abstract

In numerous symmetric θ-2θ scans of phase-pure epitaxial complex oxide thin films grown on single-crystal substrates, we observe x-ray diffraction peaks that correspond to neither the film nor the substrate crystal structure. These peaks are the result of multiple, sequential diffraction events that occur from both the film and the substrate. The occurrence of so-called “hybrid” reflections, while described in the literature, is not widely reported within the complex oxide thin-film community. We describe a simple method to predict and identify peaks resulting from hybrid reflections and show examples from epitaxial complex oxide films belonging to three distinct structural types.