Abstract

Journal Article Hybrid Pixel EELS Detector: Low Noise, High Speed, and Large Dynamic Range Get access Benjamin Plotkin-Swing, Benjamin Plotkin-Swing Nion Co., Kirkland, Washington, United States Search for other works by this author on: Oxford Academic Google Scholar Tracy Lovejoy, Tracy Lovejoy Nion Co., Kirkland, Washington, United States Search for other works by this author on: Oxford Academic Google Scholar Niklas Dellby, Niklas Dellby Nion Co., Kirkland, Washington, United States Search for other works by this author on: Oxford Academic Google Scholar George Corbin, George Corbin Nion Co., Kirkland, Washington, United States Search for other works by this author on: Oxford Academic Google Scholar Matthew Hoffman, Matthew Hoffman Nion Co., Kirkland, Washington, United States Search for other works by this author on: Oxford Academic Google Scholar Sacha De Carlo, Sacha De Carlo Dectris, Baden-Daettwil, Aargau, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Luca Piazza, Luca Piazza Dectris, Baden-Daettwil, Aargau, Switzerland Search for other works by this author on: Oxford Academic Google Scholar Chris Meyer, Chris Meyer Nion Co., Kirkland, Washington, United States Search for other works by this author on: Oxford Academic Google Scholar Andreas Mittelberger, Andreas Mittelberger Nion Co., Kirkland, Washington, United States Search for other works by this author on: Oxford Academic Google Scholar Ondrej Krivanek Ondrej Krivanek Nion Co., Kirkland, Washington, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 26, Issue S2, 1 August 2020, Pages 1928–1930, https://doi.org/10.1017/S1431927620019856 Published: 01 August 2020

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