Abstract
In-situ high-temperature, high-resolution transmission electron microscopy (HRTEM) has been performed on an Al–Cu–Co decagonal quasicrystal, to investigate thermal fluctuation of phasons. A tiling pattern with the edge length of 2 nm was constructed by connecting white spots in the HRTEM image. Local tile-rearrangements, which can be interpreted as phason flips, have been observed at temperatures above 1073 K. The frequency of the phason flip is higher at thin areas near the edge of the sample than at thick areas. The origin of such a sample-thickness dependence of the frequency of the phason flip is discussed using a simple model calculation.
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