Abstract
The energy relaxation of electrons in InN epilayers is investigated by excitation- and electric field-dependent photoluminescence (PL). From the high-energy tail of PL, we determine the electron temperature of the hot carriers. It was found that the electron temperature variation can be explained by a model in which the longitudinal optical (LO)-phonon emission is the dominant energy relaxation process. The LO-phonon lifetime is fitted to be 0.89 ps, which is higher than the theoretical phonon lifetime. This deviation is attributed to the presence of the non-equilibrium hot-phonon effects.
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