Abstract
A novel dual-polarization technique has been applied to the frequency-modulated electron density profile reflectometer on DIII-D. In this application, both O- and X-mode waves are simultaneously launched from a common high-performance solid-state source, and simultaneous measurements of both O- and X-mode reflections from corresponding cutoffs serve to expand the density coverage. The system consists of both Q-band (33–50 GHz) and V-band (50–72 GHz) subsystems, their combination covers a density range from 0 to 6.4×1019 m−3, with a time resolution of ⩾10 μs and spatial resolution of ⩾4 mm. The dual-polarization technique was implemented successfully in the Q-band subsystem during 2003 and detailed information for H-mode pedestal physics studies was provided. It has also recently been applied to the V-band subsystem, and extended contributions to H-mode pedestal physics and particle transport studies are expected during the 2004 DIII-D campaign.
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