Abstract
Metamaterial‐based microwave sensor having novel and compact structure of the resonators and the slotted microstrip transmission line is proposed for highly precise measurement of dielectric properties of the materials under test (MUTs). The proposed sensor is designed and simulated on Rogers’ substrate RO4003C by using the ANSYS HFSS software. A single and accumulative notch depth of ‐44.29 dB in the transmission coefficient (S21) is achieved at the resonant frequency of 5.15 GHz. The negative constitutive parameters (permittivity and permeability) are extracted from the S‐parameters which are the basic property of metamaterials or left handed materials (LHMs). The proposed sensor is fabricated and measured through the PNA‐X (N5247A). The sensitivity analysis is performed by placing various standard dielectric materials onto the sensor and measuring the shift in the resonant frequencies of the MUTs. A parabolic equation of the proposed sensor is formulated to approximate the resonant frequency and the relative permittivity of the MUTs. A very strong agreement among the simulated, measured, and calculated results is found which reveals that the proposed sensor is a highly precise sensor for the characterization of dielectric properties of the MUTs. Error analysis is performed to determine the accuracy of the proposed sensor. A very small percentage of error (0.81%) and a very low standard deviation are obtained which indicate high accuracy of the proposed sensor.
Highlights
Since the invention of metamaterials or left handed materials (LHMs), having unnatural and unique properties of the negative constitutive parameters [1, 2], the researchers and industries have produced numerous improved devices for the broad applications in the frequency range from RF to THz
A highly accurate complementary metamaterial sensor was proposed for the precise measurement of the relative permittivity of the materials under test
A single, sharp, and accumulative notch at -44.29 dB deep was achieved in the transmission coefficient (S21) at the resonant frequency of 5.15 GHz by etching an array of four novel and compact resonators in the ground plane of the proposed sensor
Summary
Since the invention of metamaterials or left handed materials (LHMs), having unnatural and unique properties of the negative constitutive parameters [1, 2], the researchers and industries have produced numerous improved devices for the broad applications in the frequency range from RF to THz. Metamaterials are classified into two broad groups in which one is the split ring resonators (SRRs), introduced by Pendry et al, [3] and other is the complementary SRR (CSRR), introduced by Falcone et al [4]. Owing to the small electric fringing fields, the sensors based on the SRR are less efficient for the characterization of large samples in the microwave frequency range. The CSRR is the negative image of the SRR and etched in the ground plane of the sensor They couple electrically with the microstrip line. The large electric fringing fields produce in the ground plane which has been used for the characterization of materials’ thickness [28], loss tangent [29], healthcare [30], agriculture [31], organic tissues analysis [32], and environment [33]
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