High-Performance Quantum Dot Lasers and Integrated Optoelectronics on Si

Abstract

This paper provides a review of the recent developments of self-organized In(Ga)As/Ga(Al)As quantum dot lasers grown directly on Si, as well as their on-chip integration with Si waveguides and quantum-well electroabsorption modulators. A novel dislocation reduction technique, with the incorporation of self-organized In(Ga,Al)As quantum dots as highly effective three-dimensional dislocation filters, has been developed to overcome issues associated with the material incompatibility between III-V materials and Si. With the use of this technique, quantum dot lasers grown directly on Si exhibit relatively low threshold current ( <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">J</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">th</sub> =900 A/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> ) and very high temperature stability ( <i xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">T</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">0</sub> =278 K). Integrated quantum dot lasers and quantum-well electroabsorption modulators on Si have been achieved, with a coupling coefficient of more than 20% and a modulation depth of ~100% at a reverse bias of 5 V. The monolithic integration of quantum dot lasers with both amorphous and crystalline Si waveguides, fabricated using plasma-enhanced chemical-vapor deposition and membrane transfer, respectively, has also been demonstrated.