Highly sensitive detecting system to precisely evaluate the emission spectra and quantum efficiency of organic crystal light-emitting transistors.

Abstract

The lack of a reliable and sensitive measure system has strongly hindered the progress of organic single-crystal light-emitting transistors, since their emission spectra and absolute intensity were rather difficult to be measured as a consequence of small area and weak emission, as well as their edge emission feature. Hence, a tailor-made detecting system was set up by combining a semiconductor analyzer and a rotatable microscope coupling with a highly sensitive grating spectrometer. The detecting system solved the important issue of quantitatively characterizing the optoelectronic properties of organic transistors, especially those based on single crystals. With organic lamellar single crystals, we confirmed that the measurement system was reliable and had enough sensitivity to precisely evaluate the performance of light-emitting transistors corresponding to the emission spectra.