Abstract

The initially high reflection from zinc sulphide is still further enhanced by constructive interference in thin films. By distilling sphalerite in vacuum, thin films showing first order interference and reflecting white light brilliantly are produced. The application of such films to the metallographic microscope, Michelson interferometer and other instruments is discussed.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call