Abstract
CoCrPt/Ti/Ag films with the easy axes of the hexagonal-closed-pack Co grains perpendicular to the film plane were epitaxially grown on HF-etched Si(111) single crystal substrates by rf sputter deposition. The orientation relationship was determined by x-ray pole figure measurements and transmission electron microscopy to be CoCrPt(0001)[101̄0]∥Ti(0001)[101̄0]∥Ag(111)[112̄]∥Si(111)[112̄]. The magnetic properties of the CoCrPt films were greatly improved by introducing these single crystal templates. Rocking curve measurement showed a greatly improved c-axis orientation of the cobalt alloy. Highly oriented, high coercivity properties for perpendicular recording have been obtained.
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