Abstract

Epitaxial ${\mathrm{PbZrO}}_{3}/{\mathrm{SrRuO}}_{3}/{\mathrm{SrTiO}}_{3}$ heterostructures are among the most widely studied thin-film antiferroelectrics. This paper explores their temperature-induced phase transitions and the characteristics of the domain structure by means of high-resolution synchrotron x-ray diffraction. The antiferroelectric transition order appears to change from the first to the second; peculiar in-plane $M$-point superstructures develop at high temperatures, manifesting a new phase; the $R$- and $\mathrm{\ensuremath{\Sigma}}$-point superstructure reflections demonstrate much reduced splitting as compared to the demands of the mechanical compatibility. We discuss the energetics of the reduced around-the-normal antiferroelectric domain tilts, its relation to the observed changes in phase transitions, and point to the possible contribution to the observed effect from an unusual diffraction mechanism related to the partial coherence between domains in a random nanodomain structure.

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