Abstract

Carbon based-nano materials such as fullerene, carbon nanotubes (CNTs) and graphene are nanoscale structures with excellent mechanical and electronic properties. To this end, CNT-based have been considered as sensing materials for optical sensor, chemical sensor, physical sensor and environmental sensors. CNT is widely used as a conductive material for strain sensors that detect changes external forces through electrical signals due to low conductivity. CNT-based Strain sensors were generally fabricated by transferring the individual or bundles of CNTs to the substrates using spin-coating, spraying, dip coating, and inkjet printing methods [1-2]. CNT-based Strain sensors are only weak bonding due to the van der Waals attraction force. resistance change with applied strain force because slipping of the among CNTs. so Linear changes in electrical properties at low strain, but saturation properties at high strain due to the tunneling resistance of the between CNTs [3]. In This paper, we used Silver nanowire CNT (AgNW-CNT) nanocomposite, has much improved mechanical and electrical properties of the saturation properties at high strain. As one of the most important conductive materials, Ag nanowires (AgNWs) have recently attracted a lot of attention for potential applications as transparent and flexible electrodes [4]. The nanocomposite was prepared by mixing the Agnw(0.5wt%) and CNT(0.5wt%). Then, the Agnw-CNT Coated at the sponges. This Agnw-CNT Sponge can be deformed into any shapes elastically, sustain large-strain deformations, recover most of the material volume elastically, and resist structural fatigue under cyclic stress conditions. In order to investigate the reliability and stability of Agnw-CNT Sponge sensor, repeatable tests were conducted using cyclic stretching and releasing. The sensitivity of the Agnw-CNT Sponge sensor was reliable and reproducible with fully returned to its original resistance value and improve the strain transfer, repeatability and linearity of the strain sensor. [1] Jung et al, J. Vac. Sci. Technol. 32 (2014), 04E107. [2] Han et al, Microelectron. Eng, 168 (2017), 50-54. [3] Ning Hu et al, Acta Materialia, 56 (2008), 2029-2936. [4] Feng Xu et al, Adv. Mater, (2012) , 24 , 5117-5122 Figure 1

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