Abstract
Abstract Polymer chain morphology and its response to annealing were investigated in terms of g-tensor anisotropy in poly(3-hexylthiophene) (P3HT)/fullerene blend films fabricated by dip coating. The g-anisotropy highly resolved by W-band (94 GHz) electron paramagnetic resonance (EPR) spectroscopy enabled us to precisely determine the molecular orientation of P3HT. The substrate dependence of the morphology was also investigated by W-band EPR spectroscopy. The determined morphology and EPR line width provided insight into the growth of P3HT crystalline domains, which was correlated with solar cell performance.
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