Abstract
Abstract Polymer chain morphology and its response to annealing were investigated in terms of g-tensor anisotropy in poly(3-hexylthiophene) (P3HT)/fullerene blend films fabricated by dip coating. The g-anisotropy highly resolved by W-band (94 GHz) electron paramagnetic resonance (EPR) spectroscopy enabled us to precisely determine the molecular orientation of P3HT. The substrate dependence of the morphology was also investigated by W-band EPR spectroscopy. The determined morphology and EPR line width provided insight into the growth of P3HT crystalline domains, which was correlated with solar cell performance.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
