Abstract
A novel raster-scanning method combining continuous sample translation with the fast readout of a Pilatus P6M detector has been developed on microfocus beamline I24 at Diamond Light Source. This fast grid-scan tool allows the rapid evaluation of large sample volumes without the need to increase the beam size at the sample through changes in beamline hardware. A slow version is available for slow-readout detectors. Examples of grid-scan use in centring optically invisible samples and in detecting and characterizing numerous microcrystals on a mesh-like holder illustrate the most common applications of the grid scan now in routine use on I24.
Highlights
Developments such as robotic sample changers, fast CCD and pixelarray detectors and automated data reduction have greatly increased the throughput of traditional macromolecular crystallography (MX) experiments for large crystals and sized beams
We describe a tool designed for users of the microfocus beamline I24 at Diamond Light Source that enables the straightforward and fast location of crystals and diffraction characterization of sample holders, thereby fully exploiting the advantages offered by a microfocus beamline and greatly increasing the throughput of I24
This grid-scan tool has been in routine use for more than a year on I24 and results illustrating its power and usefulness in rapid crystal detection and evaluation are presented
Summary
Developments such as robotic sample changers, fast CCD and pixelarray detectors and automated data reduction have greatly increased the throughput of traditional macromolecular crystallography (MX) experiments for large crystals (dimensions $50 Â 50 Â 50 mm and greater) and sized beams. The combination of small beam sizes and small crystals, coupled with poor optical properties of samples, have conspired to make sample alignment and detection more difficult in microbeam diffraction experiments In this short communication, we describe a tool designed for users of the microfocus beamline I24 at Diamond Light Source that enables the straightforward and fast location of crystals and diffraction characterization of sample holders, thereby fully exploiting the advantages offered by a microfocus beamline and greatly increasing the throughput of I24. We describe a tool designed for users of the microfocus beamline I24 at Diamond Light Source that enables the straightforward and fast location of crystals and diffraction characterization of sample holders, thereby fully exploiting the advantages offered by a microfocus beamline and greatly increasing the throughput of I24 This grid-scan tool has been in routine use for more than a year on I24 and results illustrating its power and usefulness in rapid crystal detection and evaluation are presented
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