Abstract
Techniques have been developed to acquire improved x-ray spectra from intense, hot laboratory plasmas. Spatially resolved high-resolution x-ray spectra is a valuable diagnostic for characterizing plasma sources.1 By mimimizing the plasma source size and with the utilization of selected x-ray diffraction crystals, x-ray line wavelengths can be measured with accuracies of 2–3 mÅ in the 10–15 Å region, provided calibration wavelengths are available or can be calculated. Dedicated experiments to determine line coincidences for x-ray laser studies is a recent application of high-resolution x-ray spectroscopy.2,3 Examples will be presented of results using laser-produced plasmas and the gas puff source for spectroscopy.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
