Abstract
This article reviews recent progress in the characterization of self-assembled monolayers (SAMs) with a chalcogen headgroup by synchrotron-based high-resolution X-ray photoelectron spectroscopy (HRXPS). We present reference data for archetypical, most frequently used SAM systems and discuss specific effects and SAM properties which can only be observed at high energy resolution. We show that not only the emissions related to a SAM but also those related to the substrate can provide important information on the system under study. We demonstrate that the standard chemical shift framework is not always sufficient to explain photoemission from SAMs, but, in some selected cases, electrostatic effects should be taken into account as well. General aspects of XPS and HRXPS experiments on SAMs are discussed, including X-ray induced damage and proper calibration procedures.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Electron Spectroscopy and Related Phenomena
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
