Abstract
High resolution X-ray Laue topography was conducted on the SPring-8 BL-28B2 beamline, operating at a 5–100 keV energy range. The use of this beamline was particularly suitable for characterization of thick samples of giant blocks of natural quartz used as seeds for growing synthetic quartz; and also to understand the propagation mechanism of dislocation lines in synthetic quartz. Area enlargement of Laue topographs by scanning the sample-film stage in the vertical direction was particularly useful for high energy diffraction images, due to their relatively small vertical dimensions. The methodology applied to characterize thick crystals used in the present research, is an effective contribution to develop nearly perfect large dimension seeds and synthetic quartz bars for the next generation of “surface acoustic waves” device substrates.
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Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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