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Abstract
The potential of high-resolution transmission electron microscopy (including the quantitative computer processing of images and computer simulation) in a local analysis of nanomaterials is discussed. A number of examples of the application of fast Fourier transform and simulated high-resolution electronmicroscopy images in the identification of nanophases and the crystallographic study of nanocrystals and nanoparticles are considered. The role that B.K. Vainshtein played in the development of a unified approach for determination of the structure of materials using short-wave diffraction is indicated.
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