Abstract
Abstract Generation of screw and 60° dislocation half-loops in silicon single crystals have been continuously observed, for the first time, with a high-resolution live X-ray topographic arrangement. A videotape has been made of the creation as well as of the motion of the dislocations. The spatial resolution achieved is about 8–10 μm. The real-time images are comparable in quality to the high-resolution topographic images recorded on conventional emulsion plates.
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