Abstract
High-resolution piezoresponse force microscopy is used to visualize imprint in polycrystalline PbZr0.25Ti0.75O3 thin films. Three-dimensional domain images show the formation of a thin bright band (∼8nm in width) running along the grain boundary after local application of a negative bias. Such bands extend completely over the region under local bias thereby forming networks. Cross-section profile analysis reveals that these are not pinned regions, rather they are formed during the switching process. This demonstrates an active role of grain boundaries in pinning a preferential polarization state. Piezoresponse hysteresis loops confirm that these regions are imprinted.
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