High Resolution Electron Imaging: an Approach to the Atomic Characterization of Materials

Abstract

This chapter discusses high resolution imaging and diffraction. It explains how chemical information can be obtained (indirectly) from lattice parameter measurements of fringe spacings, plane by plane, to smaller than 0.2 nm spatial resolution. The chapter presents a brief instructional summary of the methods employed in high resolution electron imaging. It discusses the study of internal boundaries within crystalline materials and presents an assessment of the future directions for high resolution studies in materials science. The applications of high resolution imaging illustrate a new dimension in electron microscopy. With proper care, modern transmission electron microscope (TEM) can be made to produce images of high quality using specimens that are prepared by conventional techniques. However, the interpretation of fine detail in high resolution images requires an accurate knowledge of specimen thickness, orientation, major microscope parameters (Cs, λ), and operating conditions.