High resolution digital holography

Abstract

In digital Fresnel holography, present specifications of charge-coupled device cameras require the incident beams to be quasi-parallel. That implies large speckle grain size and low lateral resolution in reconstructed images. Better lateral resolutions are demonstrated in our work, down to 8 μm, allowing the observation of sub-millimetre objects by digital holography. The experimental set-up built samples the incident light distribution with a definition of 500 pixels mm −1. The maximum acceptable angle is then widened and the hologram recording and reconstruction distances are drastically reduced, as well as the speckle size. Interferometric holography was implemented for the measurement of the deformation of a sub-millimetre silicon cantilever and results in phase-contrasts imaging are also reported. The design of dedicated complementary metal-oxide-semiconductor active pixel sensor cameras is also discussed.