Abstract
A differential optical reflectivity measurement technique for freestanding films is presented. The system is highly sensitive to changes in the polarization state of the reflected light. The method is used to study the evolution of an optically anisotropic liquid crystalline structure with temperature. In addition we present a reflectivity method for determining the film thickness for films consisting of two to hundreds of layers.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
