High-resolution 22–52 keV backlighter sources and application to X-ray radiography

Abstract

The requirement for sources of hard X-rays suitable for high resolution radiography through large ρR targets is prominent in many aspects of current laser-driven plasma physics research. In recent work using the OMEGA EP laser facility [L. J. Waxer, M. J. Guardalben, J. H. Kelly et al., CLEO/QELS, Optical Society of America, San Jose, CA, IEEE (2008)] at the Laboratory for Laser Energetics (LLE) in Rochester, NY, experiments have been performed to measure characteristics of 22–52 keV X-ray sources using high intensity short-pulse lasers. High quality point projection, two-dimensional radiography was demonstrated by irradiating microwire targets with laser intensities of 1016 W cm−2–1019 W cm−2. Microwire targets were manufactured to dimensions of 10 μm × 10 μm × 300 μm and were supported by a 100 μm × 300 μm × 6 μm low-Z substrate. Measurements of the k–α conversion efficiency and X-ray source-size are discussed and, of particular importance for radiography, the spectral purity of the backlighter is characterized to assess the relative importance of the Kα emission to bremsstrahlung background.