Abstract
Abstract HTS SFQ digital circuit applications require high resistance HTS Josephson junctions. We have investigated the factors affecting the resistance of SNS edge junctions which use Co-doped Y-Ba-Cu-O as the normal metal layer. Several parameters are found to have a surprisingly large effect on device resistance, including edge angle, base electrode material, and deposition conditions of the normal metal and counterelectrode. Controlling these factors has enabled the fabrication of high-quality, high-resistance (≈1 Ω) SNS edge junctions with 1-σ Ic spreads down to 10% and critical currents and IcRn products suitable for SFQ digital applications.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
