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Search from 250 M+ research papersSearch from 250 M+ research papershttps://doi.org/10.1007/s11277-022-10033-4
Copy DOI Journal: Wireless Personal Communications |  Publication Date: Oct 31, 2022 |
Affiliation: St Xavier’s CollegeHigh Reliability Soft Error Hardened Latch Design for Nanoscale CMOS Technology using PVT Variation
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