Abstract

Co-ferrite films with a thickness of ∼100 nm on SiO 2 (0 0 1) substrates were deposited using a pulsed laser deposition (PLD) system at different substrate temperature (ST). High coercivity of 10.5 kOe and large perpendicular anisotropy have been obtained in the film with ST at 550 °C. The microstructural investigation reveals that high coercivity with perpendicular anisotropy of these co-ferrite films is found to be related to a nanocystalline structure, large residual strain, and preferential (1 1 1) textured structure.

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