Abstract

An ideal high performance poly(etheretherketone) (PEEK)/AlN composite that has unique combination of anisotropic linear coefficient of thermal expansion (CTE) and dielectric properties was developed for the use in electronic packaging substrate as an alternative of conventionally used epoxy/E-glass substrate. The out-of-plane and in-plane CTEs of the composites were very close to that of copper and silicon chip, respectively. The dielectric constants of the composites are almost independent with increasing frequency. The dissipation factor decreased approximately 50% compared to the pure PEEK. These results reveal that the composite may be the futuristic candidate for high performance electronic packaging substrate.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.