Abstract
In an experiment performed at Stanford to look for the interference effect of the bremsstrahlung production by 575-Mev electrons in a single crystal of silicon, the ratio of the charges collected in the two halves of a double ion chamber were used to detect the enhancement of the soft component of the bremsstrahlung. The data, presented in the form of a three-dimensional plot of the ratio vs the angles of rotation between the lattice normal and the electron beam about the horizontal and the vertical axes, clearly showed the enhancement. Comparison of the experimental result and the theory showed good agreement. The resolution of this experiment was poor; hence the central minimum predicted by the theory could not be observed. This minimum, however, has been observed by Bologna et al. at Frascati.
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