High electric field characteristics of GaAsSb photodiodes on InP substrates

Abstract

Low noise avalanche photodiodes (APDs) detecting 1550 nm wavelength play a crucial role in optical communication and LiDAR systems. These APDs utilize a separate absorption, charge, and multiplication (SACM) architecture with an absorber for 1400–1650 nm detection and a low noise, high gain multiplier that can be independently optimized for a high signal-to-noise ratio. Recently, GaAs0.5Sb0.5/Al0.85Ga0.15As0.56Sb0.44 SACM APDs have demonstrated ultra-high gain and extremely low noise, possibly improving sensitivity over Si and InGaAs/InP commercial APDs. This accomplishment was achieved using a GaAsSb absorber instead of a conventional InGaAs absorber, mitigating band discontinuities between the absorber and the multiplier. However, further optimization is required to reduce noise due to tunneling and impact ionization from the GaAsSb absorber, which occurs at a high electric field region. This paper focuses on the study of the high-field characteristics of GaAsSb photodiodes (PDs). The tunneling phenomenon is analyzed through current density-voltage measurements, and the impact ionization behavior is evaluated by measuring the multiplication of p-i-n GaAsSb PDs. The result suggests that when designing a SACM APD with a GaAsSb absorber, the electric field in the absorber can be increased to 175 kV/cm without the detrimental effects of ionization occurring in the absorber. The findings from this investigation will assist in optimizing GaAsSb-based SACM APDs and promoting further advancements in the 1550 nm APD technology.