Abstract
We demonstrate stable high-brightness operation of an electron-impact water-jet-anode soft x-ray source. A 30 kV, 7.8 W electron beam is focused onto a 20 μm diameter jet resulting in water-window oxygen line emission at 525 eV/2.36 nm with a brightness of 3.0×109 ph/(s×μm2×sr×line). Monte Carlo-based modeling shows good quantitative agreement with the experiments. The source has potential to increase the x-ray power and brightness by another 1–2 orders of magnitude and fluid-dynamical jet instabilities is determined to be the most important limiting factor. The source properties make it an attractive alternative for table-top x-ray microscopy.
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