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Abstract
We have developed Johnson noise thermometry applicable to mesoscopic devices with variable source impedance with high bandwidth for fast data acquisition. By implementing differential noise measurement and two-stage impedance matching, we demonstrate noise measurement in the frequency range of 120 MHz-250MHz with a wide sample resistance range of 30 Ω-100kΩ tuned by gate voltages and temperature. We employed high-frequency, single-ended low noise amplifiers maintained at a constant cryogenic temperature in order to maintain the desired low noise temperature. We have achieved thermometer calibration with temperature precision up to 650 μK measuring a 200 mK temperature modulation on a 10K background with 30s of averaging. Using this differential noise thermometry technique, we measured thermal conductivity on a bilayer graphene sample spanning the metallic and semiconducting regimes in a wide resistance range, and we compared it to the electrical conductivity.
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