Abstract
The data retrieval resolution of spin-valve reading head is a function of the spacing between the shield layer and the free layer of the spin-valve head - the head gap. Spin-valve head is of multi-layer structure. The layer thickness variation among different wafers leads to the variation of the gap length. Therefore it is important to develop a suitable methodology for testing and evaluating the gap length fluctuation not only during the head fabrication process but also at the magnetic integration level. This paper reports a novel method for the quantitative evaluation of the gap length fluctuation among different heads. The proposed method proved to be simple and easy for implementation.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
