Hard x-ray phase contrast imaging using single absorption grating and hybrid semiconductor pixel detector

Abstract

A method for x-ray phase contrast imaging is introduced in which only one absorption grating and a microfocus x-ray source in a tabletop setup are used. The method is based on precise subpixel position determination of the x-ray pattern projected by the grating directly from the pattern image. For retrieval of the phase gradient and absorption image (both images obtained from one exposure), it is necessary to measure only one projection of the investigated object. Thus, our method is greatly simplified compared with the phase-stepping method and our method can significantly reduce the time-consuming scanning and possibly the unnecessary dose. Furthermore, the technique works with a fully polychromatic spectrum and gives ample variability in object magnification. Consequently, the approach can open the way to further widespread application of phase contrast imaging, e.g., into clinical practice. The experimental results on a simple testing object as well as on complex biological samples are presented.