Abstract
The Hf implanted Ni system has been studied by the time-differential perturbed angular correlation (TDPAC) technique and by Rutherford backscattering (RBS)/channeling. Low fluence implants were thermally annealed in vacuum at increasing temperature in order to study the evolution of substitutional and defect-associated solutes using TDPAC. Both detrapping and precipitation (or segregation) effects have been observed. Higher fluence implants were studied by both TDPAC and RBS/channeling in as-implanted as well as laser surface-melted regimes.
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More From: Nuclear Instruments and Methods in Physics Research
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