Abstract
The Hf implanted Ni system has been studied by the time-differential perturbed angular correlation (TDPAC) technique and by Rutherford backscattering (RBS)/channeling. Low fluence implants were thermally annealed in vacuum at increasing temperature in order to study the evolution of substitutional and defect-associated solutes using TDPAC. Both detrapping and precipitation (or segregation) effects have been observed. Higher fluence implants were studied by both TDPAC and RBS/channeling in as-implanted as well as laser surface-melted regimes.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Nuclear Instruments and Methods in Physics Research
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
