Abstract

The present study reports on the growth of thin TiO2 films onto Au(100) single crystals by Ti evaporation in a reactive O2 atmosphere at two different substrate temperatures: room temperature (RT) and 300°C. The growth of the oxide films was monitored by means of X-ray photoemission spectroscopy, while the valence and conduction band electronic structure was investigated by UV and inverse photoemission spectroscopy, respectively.The TiO2 film grows epitaxially on the Au(100) substrate at 300°C exhibiting the rutile (100) surface. The evolution of the Ti 2p lineshape with the oxide coverage shows the presence of reduced oxide species (characterized by Ti3+ ions) at the Au(100) interface. A crystalline and stoichiometric TiO2 oxide is produced at high substrate temperature, while growth at RT gives a measurable concentration of defects. Post growth annealing in ultra-high vacuum of the RT grown film increases this concentration, while subsequent annealing in O2 atmosphere restores the sample to the as-grown conditions.

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