Abstract
Lanthanum alunimate (LaAlO 3 ) single crystals were grown by float zone (FZ) method. (100) LaAlO 3 single crystal wafer was used as a seed. Crystal growth of LaAlO 3 without crack was achieved by the use of sintered rod with high density and homogeneity. Depending on the growth rate, the crystals showed a different color. Crystals grown in the rage of 5 to 20 mm/h exhibited a reddish-brown color, whereas crystals grown at 2 mm/h were colorless. These crystals were epitaxially grown to the seed crystal. The crystallographic information determined by IP-XRD (imaging plate X-ray diffractmeter) well agreed with the literature based on the pseudo-cubic structure. In the microstructure the grown crystals had polysynthetic twins of (100) phase on the plane perpendicular to the growth direction. The dielectric constant of each sample maintained in the vicinity of 24, while the quality factor (Qf) value depended on the growth rate. Very high Qf value of 390,000 GHz was obtained in the case of growth rate of 20 mm/h.
Published Version
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