Abstract

The growth mechanism of the Si $⟨110⟩$ faceted dendrite was studied using an in situ observation technique. We directly observed the growth process of Si faceted dendrites from Si melts. It was found that the shape of the $⟨110⟩$ faceted dendrite during growth is markedly different from that of the $⟨112⟩$ faceted dendrite; the tip of the $⟨110⟩$ faceted dendrite is narrow while that of the $⟨112⟩$ faceted dendrite is wide. We present a scheme for the growth shapes of the faceted dendrites based on the experimental evidences.

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