Abstract
Growth by the Multi-tube Physical Vapour Transport technique and characterisation of bulk (Cd,Zn)Te is described. The crystalline perfection and uniformity of zinc content have been mapped by infra-red transmission and microscopy, X-ray diffraction and photoluminescence. X-ray double crystal rocking curve full widths at half maximum as low as 43in have been obtained and a mean zinc mole fraction of 0.03 has been found to vary by less than ±0.003 over the diameter of a 50mm boule. The material exhibits a resistivity in the 2×109Ωcm range and planar devices fabricated from this material have shown electron mobility lifetime products of 4.07×10−3cm2V−1.
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