Abstract
The crystalline perfection of bulk Hg 1 − x Cd x Te layers grown by the vertical dipping LPE on CdZnTe substrates has been studied from the X-ray double crystal rocking curve (DCRC) and scanning electron microscopy (SEM) techniques. The structural quality of Hg 1 − x Cd x Te bulk epilayers is better than that of the interface between the substrate and epilayer. The full width at half maximum (FWHM) of DCRCs was measured on a two-dimensional array of points over epilayer surface. Therefore the map of the structural uniformity of Hg 1 − x Cd x Te epilayers can be obtained in this way. The structural uniformity of the bulk Hg 1 − x Cd x Te epilayers is also observed in the growth direction. The dislocation density map of Hg 1 − x Cd x Te bulk epilayer is calculated using the map of the FWHM values.
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