Abstract
Growth behavior and evolution of magnetism as a function of Fe thin film thickness onto organic semiconductor tris(8-hydroxyquinoline)-aluminum, (Alq3) thin film was investigated in-situ using electrical resistance and magneto-optic Kerr effect (MOKE) measurements, respectively. The variation of electrical resistance with Fe film thickness reveals the Volmer-Weber growth of Fe on Alq3 film. Reflection high energy electron diffraction (RHEED) pattern resembles polycrystalline BCC structure of Fe. Ex-situ x-ray reflectivity (XRR) measurement from the Fe/Alq3/Si sample reveals that Fe diffuses into Alq3 to form an alloy layer of 50 Å thickness with Fe volume fraction of 0.4. In-situ MOKE study affirms anomalous magnetic behavior at the initial stage of Fe growth. Initially hysteresis loop appears and develops in a particular direction, and then vanishes at certain thickness. With further growth of Fe hysteresis loop appears again and grows in the opposite direction. The observed unusual changes in magnetic behavior as a function of Fe thickness may be explained in terms of the contribution from the magnetic Fe-Alq3 alloy present in the intermix layer, the metallic Fe on top of Alq3 layer, and their antiferromagnetic coupling.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
