Abstract
White carbon films were synthesized by microwave plasma chemical vapor deposition. Irregular flakiness microstructure consisting of nanocrystalline grains of the as-grown film was observed by scanning electron microscope. The films have a metallic gray to white color, with reflectivity of 12.56%–21.58% in the visible region. The diffraction line at 2θ=21.6° (d=0.4107nm), shown in x-ray diffraction spectrum of the film, corresponds to the (110) facet of β modifications of white carbon. The peak position at 283.46eV in the x-ray photoelectron spectrum represents binding energy of C1s core level of sp1 hybridization of carbon. Field electron emission characteristics of the film were tested. A turn-on field of 3.5V∕μm was obtained.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
