Abstract
YbBa2Cu3O7−x (YbBCO) thick films were grown on buffered, cube-textured Nickel tapes by sol–gel dip-coating method. Yb-123 films were prepared using solutions of Yb, Ba, and Cu organometallic compounds. A solution-based Gd2O3 buffer layer was deposited by dip-coating process with excellent texture and uniformity. The texture development and surface morphology of the buffer-layer films were examined by X-ray diffraction, pole figures, and ESEM analysis. Microstructure and characterization of Yb-123 films were done by ESEM, EDS, and XRD analysis. Tc and Jc were conducted by four-wire measurement method
Published Version
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